Chromium oxide films grown by molecular beam epitaxy on MgO ( 001) substrates were characterized by x_ray diffraction ( XRD) and x_ray reflectivity ( XRR) measurements.

  • 采用分子束外延技术(MBE)在MgO(001)基板上沉积了氧化铬薄膜,并利用x射线衍射(XRD)和x射线反射谱(XRR)对薄膜的晶体结构进行了表征。

  • 互联网摘选 2025-01-20 17:33:06

    • 相关例句
    精确
    • 模糊
    • 词首
    • 词尾
    • 词义
    • 例句