To analyze the influence of external vibration on the tip-sample interaction of scanning probe microscope ( SPM), a concept, vibration rejection ratio ( VRR), was proposed.

  • 为分析外界振动对扫描探针显微镜(SPM)针尖-样品副的影响,提出抑振系数的概念。

  • 互联网摘选 2025-01-20 17:34:57

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