The errors caused by the phase uncertainties of embedded parameters are deleted. In addition, LRL method can be used to de-embed the S parameters from the microwave transistor test fixture.

  • 由于利用代数消去法,去除了嵌入参量相位不确定性引入的误差,LRL法可用于微波晶体管测试夹具的去嵌入。

  • 互联网摘选 2025-01-20 17:43:31

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