Research shows that the LFN characteristics of GaAs devices can be used to detect information related to traps and defects inside them and conduct reliability characterization.

  • 研究表明,利用GaAs器件的低频噪声特性可以获得器件内部陷阱和缺陷相关信息,对器件进行基于噪声的可靠性表征。

  • 互联网摘选 2025-01-20 17:44:09

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