Boundary scan testing based on design-for-testability is a new method to test VLSI. This method can greatly reduce the complexity of VLSI test generation, so it has been studied extensively in the fields of design and test of integrated circuit in recent years.

  • 边缘扫描测试是对大规模集成电路(VLSI)进行测试的一种新的基于可测性设计的测试技术,能极大地降低VLSI测试生成的复杂性,在电路设计与测试领域,近年来得到广泛关注。

  • 互联网摘选 2025-01-20 13:31:58

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