The microstructure and electric property of thin films were investigated by XRD and dark conductivity measurements.

  • 利用X射线 衍射仪(XRD)分析退火后的薄膜晶体结构,用电导率测试仪测试其暗电导率.

  • 互联网摘选 2025-01-20 13:32:25

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