xrd

Composition of inorganic phases and order degree of lamellar structure were characterized by X-ray diffraction ( XRD ).

用XRD表征了合成产物的无机相组成和 层状结构 的有序度.

The mini X-ray diode ( M-XRD ) was developed, and was used in mini soft X-ray spectrometer.

研制了小型 X 光二极管(XRD ), 可用于小型软 X 光能谱仪.

The precursor and powder were characterized by XRD 、 DTA 、 ICP 、 TEM 、 BET.

采用XRD、DTA、ICP、TEM、BET等 手段表征了前驱体和产物的特征.

XRD, SEM and EDS are also used to analyze the ceramic powder.

XRD 、 SEM和 EDS分别用于分析和观察抗茵粉体的晶相结构、形貌及其元素成分.

And the catalysts structure is characterized by IR, XRD and BET.

并使用IR 、 XRD、BET等 表征手段分析了催化剂的结构与性能.

The microstructure has been studied using SEM, EDS and XRD.

用扫描电镜(SEM) 、 能谱(EDS)和X射线 衍射(XRD)测试其微观结构.

The crystallization of three K 2 O-B 2 O 3-SiO 2 glasses has been studied by using DTA, XRD 、 TEM and SEM technique.

本文利用DTA 、 XRD、TEM、SEM等技术研究了三种K2O-B2O3-SiO2玻璃的析晶性能.

By XRD analysis the layer is maily composed of TiN and Ti 2 N.

XRD分析证实膜层结构主要由TiN和Ti2N组成.

X-ray diffraction ( XRD ) and transmission electron microscopy ( SEM ) to characterization.

X 射线衍射 ( XRD ) 及透射电子显微镜 ( SEM ) 来表征.

The analysis of SEM and XRD approved the formation of zeolite.

SEM及XRD分析证实了沸石结晶的生成.

The phase structure and microstructure of materials were study by XRD, IR and SEM.

采用XRD 、 IR及SEM等方法研究材料的相组成与显微结构.

Structures and heat performance of the nanocomposites were investigated with XRD, AFM and TGA.

通过XRD, AFM,TGA测试分析了所制备的复合材料的结构与热性能.

The microstructure and electric property of thin films were investigated by XRD and dark conductivity measurements.

利用X射线 衍射仪(XRD)分析退火后的薄膜晶体结构,用电导率测试仪测试其暗电导率.

X — Ray Diffraction ( XRD ) spectra indicate that these compounds are single perovskite in structure.

X射线衍射 ( XRD ) 鉴定均为单一相钙钛矿型氧化物.

The phase structure and surfaceappearance were analysed through SEM, EDS, XRD.

应用扫描电镜(SEM) 、 能谱仪(EDS)和X射线 衍射(XRD)等手段分析研究了氧化铝膜的相结构和表面形貌.