LRL Calibration Method and Its Application to Microwave Measurement
LRL校准法及其在微波测量中的应用
The problem of measurements for microwave devices is considered, and a physical model for LRL ( Line-Reflect-Line) calibration method is described.
讨论了微波器件的测量问题,阐明了LRL(Line-Reflect-Line)校准法的物理模型。
The errors caused by the phase uncertainties of embedded parameters are deleted. In addition, LRL method can be used to de-embed the S parameters from the microwave transistor test fixture.
由于利用代数消去法,去除了嵌入参量相位不确定性引入的误差,LRL法可用于微波晶体管测试夹具的去嵌入。
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