We are using the xyz technique to light our world.

Why do you not provide packages for distribution XYZ?

为什么不为不同的发行版提供不同的发行包?

Good morning. I'm the manager of the import division of XYZ Co. Ltd. Here is my card.

早上好. 我是XYZ有限公司的进口部经理,这是我的名片.

I couldn't sleep last night when I heard that the XYZ company was closing down suddenly.

我不能入睡,昨晚当我听说的xyz公司被关闭,突然.

Due to the struggling economy, XYZ company let go a dozen employees, including me.

由于经济情况恶化, XYZ公司解雇了大量员工, 包括我.

XYZ all apply imported screw, high precision gear frame and linear guide, ensure the high accuracy.

XYZ采用全进口丝杆或高精度齿条出论结构、直线导轨, 精度更高.

Are you an employee looking for XYZ?

你是要找XYZ的员工 吗 ?

Are you a manager looking for XYZ?

你是要找XYZ的经理 吗 ?

Please find attached the letter to XYZ from us, the ABC Company.

附件是我ABC公司致XYZ的信函,请你查收.

Productivity at the XYZ company was up slightly this month over last.

XYZ公司本月的生产比上月略有提高.

XUL provides the ability to create most elements found in modern graphical interfaces.

XUL提供了创建大多数当今流行的图形界面元素的功能.

This tutorial attempts to cover much of XUL's functionality, however, not all features are discussed.

这个参考手册尝试包含大多数的XUL功能, 但是不会讨论到所有的功能.

Left, Yin Xue, 9, practiced walking with her prostheticleg.

图为9岁的林薛学着使用假肢走路.

Daniel: Then you must know Shen Xue and Zhao Hongbo.

丹尼尔: 那你一定知道申雪和赵宏博了.

So Aunt Xue and her children moved into Pear Fragrance Court.

从此后薛家母子就在梨香院住了.

In this paper, a method of Zn in the compound Hg _ ( 1-x ) Zn _ xTe by AAS is described.

本文提出了一种用原子吸收光度法测定半导体化合物Hg_ ( 1-x ) Zn_xTe中锌的组分数x值的方法.

The precision and accuracy of the XRF method are excellent as compared with classical chemical method.

经对样品制备精密度及测量准确度分析,X射线 荧光光谱法测量准确度和精密度能满足传统化学法要求.

Three elements in the reference materials of Sn alloy were analyzed by ED-XRF.

本文提出 X 荧光能谱法测定锡基合金中三个元素含量的方法.

Are the XRF calibration records current and are appropriate XRF standards used to verify calibration?

目前是否有XRF校准记录于接近XRF标准的方法用于确认精确度?

The phase structure and microstructure of materials were study by XRD, IR and SEM.

采用XRD 、 IR及SEM等方法研究材料的相组成与显微结构.

The microstructure and electric property of thin films were investigated by XRD and dark conductivity measurements.

利用X射线 衍射仪(XRD)分析退火后的薄膜晶体结构,用电导率测试仪测试其暗电导率.