Improvement of testability: For the purpose of reducing test cost and obtaining higher fault coverage, several Design-for-Testability ( DFT) methodologies of the circuit are concerned.

  • 可测性的改善。为了降低测试成本和提高故障覆盖率,必须对原芯核电路进行可测性设计,为此本文研究了几种用以提高电路可测性的措施。

  • 互联网摘选 2025-01-20 13:31:58

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